Advanced microstructure, morphology and CO gas sensor properties of Cu/Ni bilayers at nanoscale

In this study, we investigated the morphology of synthesized Cu/Ni nanoparticles in trace of carbon sources by the co-deposition process of RF sputtering and RF-PECVD methods and localized surface plasmon resonance of CO gas sensing of Cu/Ni nanoparticles. The surface morphology was studied by analy...

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Published inScientific reports Vol. 12; no. 1; pp. 12002 - 9
Main Authors Ghaderi, Atefeh, Shafiekhani, Azizollah, Solaymani, Shahram, Ţălu, Ştefan, da Fonseca Filho, Henrique Duarte, Ferreira, Nilson S., Matos, Robert Saraiva, Zahrabi, Hadi, Dejam, Laya
Format Journal Article
LanguageEnglish
Published London Nature Publishing Group UK 14.07.2022
Nature Publishing Group
Nature Portfolio
Subjects
639/301
639/925
Atomic force microscopy
Carbon sources
Humanities and Social Sciences
Image processing
Micrography
Morphology
multidisciplinary
Nanoparticles
Resonance
Science
Science (multidisciplinary)
Spectrometry
Statistical analysis
Surface plasmon resonance
Thin films
Variance analysis
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Summary:In this study, we investigated the morphology of synthesized Cu/Ni nanoparticles in trace of carbon sources by the co-deposition process of RF sputtering and RF-PECVD methods and localized surface plasmon resonance of CO gas sensing of Cu/Ni nanoparticles. The surface morphology was studied by analyzing 3D micrographs of atomic force microscopy using image processing techniques and fractal/multifractal analyses. The MountainsMap® Premium software with the two-way ANOVA (Variance analysis) and least-significant differences tests were used for statistical analysis. The surface nano-patterns have a local and global particular distribution. Experimental and simulated Rutherford backscattering spectra confirm the quality of nanoparticles. Then, prepared samples were exposed to CO gas flue to study their gas sensor application using the localized surface plasmon resonance method. Increasing the Ni layer over Cu one shows an interesting result in both morphology and gas sensing sides. Advanced stereometric analyses for the surface topography of thin films in conjunction with Rutherford backscattering spectrometry and Spectroscopic analysis make a unique study in the field.
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ISSN:2045-2322
2045-2322
DOI:10.1038/s41598-022-16347-4