Scherrer grain-size analysis adapted to grazing-incidence scattering with area detectors

Ever since its formulation, the Scherrer formula has been the workhorse for quantifying finite size effects in X‐ray scattering. Various aspects of Scherrer‐type grain‐size analysis are discussed with regard to the characterization of thin films with grazing‐incidence scattering methods utilizing ar...

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Bibliographic Details
Published inJournal of applied crystallography Vol. 42; no. 6; pp. 1030 - 1034
Main Author Smilgies, Detlef-M.
Format Journal Article
LanguageEnglish
Published 5 Abbey Square, Chester, Cheshire CH1 2HU, England International Union of Crystallography 01.12.2009
Blackwell Publishing Ltd
Subjects
Finite element analysis
Grain size
grazing-incidence small-angle scattering (GISAXS)
grazing-incidence wide-angle scattering (GIWAXS)
Limiting factors
Particle size
Research Papers
Scattering
Scherrer formula
soft materials
Thin films
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Summary:Ever since its formulation, the Scherrer formula has been the workhorse for quantifying finite size effects in X‐ray scattering. Various aspects of Scherrer‐type grain‐size analysis are discussed with regard to the characterization of thin films with grazing‐incidence scattering methods utilizing area detectors. After a brief review of the basic features of Scherrer analysis, a description of resolution‐limiting factors in grazing‐incidence scattering geometry is provided. As an application, the CHESS D1 beamline is characterized for typical scattering modes covering length scales from the molecular scale to the nanoscale.
Bibliography:istex:98BA12EC2B559A363FC3F95AA1C48F44A9939DE5
ArticleID:JCRCE5066
ark:/67375/WNG-FW026K59-2
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ISSN:1600-5767
0021-8898
1600-5767
DOI:10.1107/S0021889809040126