Contactless probing of the intrinsic carrier transport single-walled carbon nanotubes

• Published in: Nano research Vol. 7; no. 11; pp. 1623 - 1630
• Main Authors: Li, Yize Stephanie, Ge, Jun, Cai, Jinhua, Zhang, Jie, Lu, Wei, Liu, Jia, Chen, Liwei
• Format: Journal Article
• Language: English
• Published: Heidelberg Tsinghua University Press 01.11.2014; Springer Nature B.V
• Subjects: Atomic/Molecular Structure and Spectra; Biomedicine; Biotechnology; Carbon; Carrier transport; Chemical vapor deposition; Chemistry and Materials Science; Condensed Matter Physics; Dielectric properties; Electric potential; Electrons; Experiments; Materials Science; Mathematical models; Microscopy; Nanomaterials; Nanostructure; Nanotechnology; Nanowires; Research Article; Semiconductor research; Single wall carbon nanotubes; Transistors; Transport; Voltage; 介电响应; 单壁碳纳米管; 场效应晶体管; 本征; 纳米级分辨率; 载流子传输; 输运特性; 非接触式探测; United States > US; carrier mobility; carrier density; electronic transport; field-effect transistor; dielectric force microscopy; single-walled carbon nanotubes

Intrinsic carrier transport properties of single-walled carbon nanotubes have been probed by two parallel methods on the same individual tubes： The contactless dielectric force microscopy （DFM） technique and the conventional field-effect transistor （FET） method. The dielectric responses of SWNTs are...