A multireflection and multiwavelength residual stress determination method using energy dispersive diffraction

• Published in: Journal of applied crystallography Vol. 51; no. 3; pp. 732 - 745
• Main Authors: Marciszko, Marianna, Baczmański, Andrzej, Klaus, Manuela, Genzel, Christoph, Oponowicz, Adrian, Wroński, Sebastian, Wróbel, Mirosław, Braham, Chedly, Sidhom, Habib, Wawszczak, Roman
• Format: Journal Article
• Language: English
• Published: 5 Abbey Square, Chester, Cheshire CH1 2HU, England International Union of Crystallography 01.06.2018; Blackwell Publishing Ltd
• Subjects: Data processing; Energy; energy dispersive diffraction; Engineering Sciences; hexagonal structures; MGIXD; MMXD; multireflection and multiwavelength X‐ray diffraction; multireflection grazing incidence diffraction; Particle beams; Radiation; Research Papers; Residual stress; Synchrotron radiation; Wave reflection; Wavelengths; X-ray diffraction; energy dispersive diffraction; residual stress; multireflection grazing incidence diffraction; MGIXD; multireflection and multiwavelength X-ray diffraction; MMXD; hexagonal structures; synchrotron radiation
• ISSN: 1600-5767; 0021-8898; 1600-5767
• DOI: 10.1107/S1600576718004193

The main focus of the presented work was the investigation of structure and residual stress gradients in the near‐surface region of materials studied by X‐ray diffraction. The multireflection method was used to measure depth‐dependent stress variation in near‐surface layers of a Ti sample (grade 2) subjected to different mechanical treatments. First, the multireflection grazing incidence diffraction method was applied on a classical diffractometer with Cu Kα radiation. The applicability of the method was then extended by using a white synchrotron beam during an energy dispersive (ED) diffraction experiment. An advantage of this method was the possibility of using not only more than one reflection but also different wavelengths of radiation. This approach was successfully applied to analysis of data obtained in the ED experiment. There was good agreement between the measurements performed using synchrotron radiation and those with Cu Kα radiation on the classical diffractometer. A great advantage of high‐energy synchrotron radiation was the possibility to measure stresses as well as the a0 parameter and c0/a0 ratio for much larger depths in comparison with laboratory X‐rays. Multireflection grazing‐incidence X‐ray diffraction was used to investigate the structure and residual stress gradients in the near‐surface region of mechanically treated titanium samples. The development of this method by using a white synchrotron beam during an energy dispersive diffraction experiment is proposed.