A Low-Cost Measurement Methodology for LiDAR Receiver Integrated Circuits

• Published in: Sensors (Basel, Switzerland) Vol. 23; no. 13; p. 6002
• Main Authors: Joo, Ji-Eun, Choi, Shinhae, Chon, Yeojin, Park, Sung-Min
• Format: Journal Article
• Language: English
• Published: Switzerland MDPI AG 28.06.2023; MDPI
• Subjects: Algorithms; Amplifiers, Electronic; Analog circuits; Analysis; Circuit components; Circuits; CMOS; Communication; Communications equipment; Complementary metal oxide semiconductors; Dementia; Detectors; Diodes; Electrostatic discharges; Equipment Design; Errors; Integrated circuits; Lasers; LiDAR; Measurement; measurements; Methods; Noise; Optical radar; optoelectronics; Performance evaluation; Power supply; Remote sensing; Semiconductor chips; Semiconductor lasers; Sensors; TDC; CMOS; TDC; IC; optoelectronics; LiDAR; measurements
• ISSN: 1424-8220; 1424-8220
• DOI: 10.3390/s23136002

This paper presents a test methodology to facilitate the measuring processes of LiDAR receiver ICs by avoiding the inherent walk error issue. In a typical LiDAR system, a costly laser diode driver emits narrow light pulses with fast rising edges, and the reflected pulses from targets enter an optical detector followed by an analog front-end (AFE) circuit. Then, the received signals pass through the cascaded amplifiers down to the time-to-digital converter (TDC) that can estimate the detection range. However, this relatively long signal journey leads to the significant decline of rising-edge slopes and the output pulse spreading, thus producing inherent walk errors in LiDAR receiver ICs. Compensation methods requiring complex algorithms and extra chip area have frequently been exploited to lessen the walk errors. In this paper, however, a simpler and lower-cost methodology is proposed to test LiDAR receiver ICs by employing a high-speed buffer and variable delay cells right before the TDC. With these circuits, both START and STOP pulses show very similar pulse shapes, thus effectively avoiding the walk error issue. Additionally, the time interval between two pulses is easily determined by varying the number of the delay cells. Test chips of the proposed receiver IC implemented in a 180-nm CMOS process successfully demonstrate easier and more accurate measurement results.