Comparison Between Potentiometric and Stripping Voltammetric Detection of Trace Metals: Measurements of Cadmium and Lead in the Presence of Thalium, Indium, and Tin

Recent advances in ion‐selective electrodes have pushed the detection limits of direct potentiometry to the nanomolar concentration range. Here we present a direct comparison of the sensitivity and selectivity of potentiometric and stripping‐voltammetric measurements of cadmium and lead. While both...

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Bibliographic Details
Published inElectroanalysis (New York, N.Y.) Vol. 21; no. 17-18; pp. 1939 - 1943
Main Authors Chumbimuni-Torres, Karin Y., Calvo-Marzal, Percy, Wang, Joseph
Format Journal Article
LanguageEnglish
Published Weinheim WILEY-VCH Verlag 01.09.2009
WILEY‐VCH Verlag
Subjects
Cadmium
Lead
Potentiometry
Selectivity
Sensitivity
Stripping voltammetry
Trace analysis
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Summary:Recent advances in ion‐selective electrodes have pushed the detection limits of direct potentiometry to the nanomolar concentration range. Here we present a direct comparison of the sensitivity and selectivity of potentiometric and stripping‐voltammetric measurements of cadmium and lead. While both techniques offer a similar sensitivity, the potentiometric method offers higher selectivity in the presence of excess of metal ions (e.g., thallium, tin) that commonly interfere in the stripping‐voltammetric operation. Because of the complementary nature of the potentiometric and stripping‐voltammetric methods, it is recommended that these techniques will be selected based on the specific analytical problem or used in parallel to provide additional analytical information.
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ArticleID:ELAN200904613
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ISSN:1040-0397
1521-4109
DOI:10.1002/elan.200904613