Macro- and micro-strain in GaN nanowires on Si(111)
We analyze the strain state of GaN nanowire ensembles by x-ray diffraction. The nanowires are grown by molecular beam epitaxy on a Si(111) substrate in a self-organized manner. On a macroscopic scale, the nanowires are found to be free of strain. However, coalescence of the nanowires results in micr...
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Published in | Nanotechnology Vol. 22; no. 29; p. 295714 |
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Main Authors | , , , , , |
Format | Journal Article |
Language | English |
Published |
England
IOP Publishing
22.07.2011
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Online Access | Get full text |
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Summary: | We analyze the strain state of GaN nanowire ensembles by x-ray diffraction. The nanowires are grown by molecular beam epitaxy on a Si(111) substrate in a self-organized manner. On a macroscopic scale, the nanowires are found to be free of strain. However, coalescence of the nanowires results in micro-strain with a magnitude from ± (0.015)% to ± (0.03)%. This micro-strain contributes to the linewidth observed in low-temperature photoluminescence spectra. |
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Bibliography: | ObjectType-Article-1 SourceType-Scholarly Journals-1 ObjectType-Feature-2 content type line 23 |
ISSN: | 0957-4484 1361-6528 |
DOI: | 10.1088/0957-4484/22/29/295714 |