A new ion sensing deep atomic force microscope

• Published in: Review of scientific instruments Vol. 85; no. 8; p. 083706
• Main Authors: Drake, Barney, Randall, Connor, Bridges, Daniel, Hansma, Paul K
• Format: Journal Article
• Language: English
• Published: United States 01.08.2014
• Subjects: Ions - analysis; Microscopy, Atomic Force - instrumentation; Microscopy, Atomic Force - methods
• ISSN: 1089-7623
• DOI: 10.1063/1.4893640

Here we describe a new deep atomic force microscope (AFM) capable of ion sensing. A novel probe assembly incorporates a micropipette that can be used both for sensing ion currents and as the tip for AFM imaging. The key advance of this instrument over previous ion sensing AFMs is that it uses conventional micropipettes in a novel suspension system. This paper focuses on sensing the ion current passively while using force feedback for the operation of the AFM in contact mode. Two images are obtained simultaneously: (1) an AFM topography image and (2) an ion current image. As an example, two images of a MEMS device with a microchannel show peaks in the ion current as the pipette tip goes over the edges of the channel. This ion sensing AFM can also be used in other modes including tapping mode with force feedback as well as in non-contact mode by utilizing the ion current for feedback, as in scanning ion conductance microscopy. The instrument is gentle enough to be used on some biological samples such as plant leaves.