Solution Heat Treatment of the Single Crystal Nickel-Base Superalloy CMSX-4 Fabricated by Selective Electron Beam Melting

Selective electron beam melting (SEBM), which belongs to the additive manufacturing processes, is applied to produce samples from the single crystalline nickel‐base superalloy CMSX‐4. The influence of the high solidification rates on the microstructure and element distribution is investigated by OM,...

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Published inAdvanced engineering materials Vol. 17; no. 10; pp. 1486 - 1493
Main Authors Ramsperger, Markus, Mújica Roncery, Laís, Lopez-Galilea, Inmaculada, Singer, Robert F., Theisen, Werner, Körner, Carolin
Format Journal Article
LanguageEnglish
Published Blackwell Publishing Ltd 01.10.2015
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Summary:Selective electron beam melting (SEBM), which belongs to the additive manufacturing processes, is applied to produce samples from the single crystalline nickel‐base superalloy CMSX‐4. The influence of the high solidification rates on the microstructure and element distribution is investigated by OM, SEM, DSC, and EMPA. Solution heat treatments at different temperatures and holding times are applied to demonstrate the difference between conventionally cast and SEBM material. The results demonstrate that SEBM is able to produce superalloys with a degree of homogeneity which cannot be realized in conventional processes. Selective electron beam melting (SEBM) manufacturing of CMSX‐4 leads to a very fine solidification structure which is two orders of magnitude smaller than in conventional castings (e.g., Bridgman). Microprobe mappings of Re distribution in CMSX‐4 can be used to show the differences in homogeneity (a and b). Due to the homogeneity, a solution heat treatment (HT) of 4 min (1320 °C) is already sufficient for homogenization of SEBM CMSX‐ 4 (c).
Bibliography:ark:/67375/WNG-9XKDL3Q2-V
ArticleID:ADEM201500037
The German Research Association (DFG) and the Collaborative Research Center 103 project B2 and B4 are thankfully acknowledged for the financial support. The authors also acknowledge Sabine Michel for the microprobe mappings and Tina Johnscher.
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ISSN:1438-1656
1527-2648
DOI:10.1002/adem.201500037