X‐ray diffraction with micrometre spatial resolution for highly absorbing samples

• Published in: Journal of synchrotron radiation Vol. 29; no. 6; pp. 1407 - 1413
• Main Authors: Chakrabarti, Prerana, Wildeis, Anna, Hartmann, Markus, Brandt, Robert, Döhrmann, Ralph, Fevola, Giovanni, Ossig, Christina, Stuckelberger, Michael Elias, Garrevoet, Jan, Falch, Ken Vidar, Galbierz, Vanessa, Falkenberg, Gerald, Modregger, Peter
• Format: Journal Article
• Language: English
• Published: 5 Abbey Square, Chester, Cheshire CH1 2HU, England International Union of Crystallography 01.11.2022; John Wiley & Sons, Inc
• Subjects: Goniometers; Grain boundaries; high photon energy; high spatial resolution; Ion beams; Martensitic stainless steels; Photons; Photovoltaic cells; Refractive lenses; Research Papers; Residual stress; Solar cells; Spatial resolution; Thin films; Translations; X-ray diffraction; X‐ray fluorescence; X-ray diffraction; high spatial resolution; high photon energy; X-ray fluorescence; goniometers
• ISSN: 1600-5775; 0909-0495; 1600-5775
• DOI: 10.1107/S1600577522008025

X‐ray diffraction with high spatial resolution is commonly used to characterize (poly)crystalline samples with, for example, respect to local strain, residual stress, grain boundaries and texture. However, the investigation of highly absorbing samples or the simultaneous assessment of high‐Z materials by X‐ray fluorescence have been limited due to the utilization of low photon energies. Here, a goniometer‐based setup implemented at the P06 beamline of PETRA III that allows for micrometre spatial resolution with a photon energy of 35 keV and above is reported. A highly focused beam was achieved by using compound refractive lenses, and high‐precision sample manipulation was enabled by a goniometer that allows up to 5D scans (three rotations and two translations). As experimental examples, the determination of local strain variations in martensitic steel samples with micrometre spatial resolution, as well as the simultaneous elemental distribution for high‐Z materials in a thin‐film solar cell, are demonstrated. The proposed approach allows users from the materials‐science community to determine micro‐structural properties even in highly absorbing samples. A demonstration of high‐resolution micro X‐ray diffraction at high photon energies for highly absorbing samples.