Nanocolumnar Preferentially Oriented PSZT Thin Films Deposited on Thermally Grown Silicon Dioxide

We report the first instance of deposition of preferentially oriented, nanocrystalline, and nanocolumnar strontium-doped lead zirconate titanate (PSZT) ferroelectric thin films directly on thermal silicon dioxide. No intermediate seed or activation layers were used between PSZT and silicon dioxide....

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Bibliographic Details
Published inNanoscale research letters Vol. 4; no. 1; pp. 29 - 33
Main Authors Sriram, S, Bhaskaran, M, Mitchell, A, Mitchell, D. R. G, Kostovski, G
Format Journal Article
LanguageEnglish
Published New York New York : Springer-Verlag 01.01.2009
Springer New York
Springer Nature B.V
Springer
Subjects
Chemistry and Materials Science
Materials Science
Molecular Medicine
Nano Express
Nanochemistry
Nanoscale Science and Technology
Nanotechnology
Nanotechnology and Microengineering
PSZT thin films
XRD
Microscopy
Silicon dioxide
Nanocrystal
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Summary:We report the first instance of deposition of preferentially oriented, nanocrystalline, and nanocolumnar strontium-doped lead zirconate titanate (PSZT) ferroelectric thin films directly on thermal silicon dioxide. No intermediate seed or activation layers were used between PSZT and silicon dioxide. The deposited thin films have been characterised using a combination of diffraction and microscopy techniques.
Bibliography:http://dx.doi.org/10.1007/s11671-008-9197-2
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ISSN:1931-7573
1556-276X
1556-276X
DOI:10.1007/s11671-008-9197-2