Photovoltaic properties and photoconductivity in multilayer Ge/Si heterostructures with Ge nanoislands

Interband optical transitions in multilayer heterostructures with SiGe nanoislands were investigated using photocurrent spectroscopy and photo-emf. The n - p heterostructures containing Ge nanoislands in the area of the potential barrier were prepared by molecular-beam epitaxy at the temperature abo...

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Published inJournal of materials science Vol. 46; no. 17; pp. 5737 - 5742
Main Authors Kondratenko, S. V., Vakulenko, O. V., Kozyrev, Yu. N., Rubezhanska, M. Yu, Naumovets, A. G., Nikolenko, A. S., Lysenko, V. S., Strelchuk, V. V., Teichert, C.
Format Journal Article
LanguageEnglish
Published New York Springer US 01.09.2011
Springer
Springer Nature B.V
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Summary:Interband optical transitions in multilayer heterostructures with SiGe nanoislands were investigated using photocurrent spectroscopy and photo-emf. The n - p heterostructures containing Ge nanoislands in the area of the potential barrier were prepared by molecular-beam epitaxy at the temperature about 500 °C. It was shown that electron transitions from the ground state of the valence band in a nanoislands to the conduction band of Si surrounding made the main contribution into the vertical photo-emf in the range 0.75–1.05 eV, which is below the interband absorption edge of Si. The lateral photoconductivity observed in the range 0.63–0.8 eV at 77 K can be attributed to indirect interband transitions from the ground state of a nanoisland to L -state of the conduction band of a nanoisland. Analysis of Raman scattering spectra revealed that the Ge composition x in a nanoisland is about 0.87, while elastic deformation value amounts to ε xx  = −0.016. The calculated energies of interband transitions from the ground state of a nanoisland to the conduction band of Si surrounding (0.63 eV) and to L -state of the conduction band of a nanoisland (0.81 eV) fit the experimental data with a rather good accuracy.
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ISSN:0022-2461
1573-4803
DOI:10.1007/s10853-011-5528-2