Photovoltaic properties and photoconductivity in multilayer Ge/Si heterostructures with Ge nanoislands
Interband optical transitions in multilayer heterostructures with SiGe nanoislands were investigated using photocurrent spectroscopy and photo-emf. The n - p heterostructures containing Ge nanoislands in the area of the potential barrier were prepared by molecular-beam epitaxy at the temperature abo...
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Published in | Journal of materials science Vol. 46; no. 17; pp. 5737 - 5742 |
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Main Authors | , , , , , , , , |
Format | Journal Article |
Language | English |
Published |
New York
Springer US
01.09.2011
Springer Springer Nature B.V |
Subjects | |
Online Access | Get full text |
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Summary: | Interband optical transitions in multilayer heterostructures with SiGe nanoislands were investigated using photocurrent spectroscopy and photo-emf. The
n
-
p
heterostructures containing Ge nanoislands in the area of the potential barrier were prepared by molecular-beam epitaxy at the temperature about 500 °C. It was shown that electron transitions from the ground state of the valence band in a nanoislands to the conduction band of Si surrounding made the main contribution into the vertical photo-emf in the range 0.75–1.05 eV, which is below the interband absorption edge of Si. The lateral photoconductivity observed in the range 0.63–0.8 eV at 77 K can be attributed to indirect interband transitions from the ground state of a nanoisland to
L
-state of the conduction band of a nanoisland. Analysis of Raman scattering spectra revealed that the Ge composition
x
in a nanoisland is about 0.87, while elastic deformation value amounts to ε
xx
= −0.016. The calculated energies of interband transitions from the ground state of a nanoisland to the conduction band of Si surrounding (0.63 eV) and to
L
-state of the conduction band of a nanoisland (0.81 eV) fit the experimental data with a rather good accuracy. |
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Bibliography: | ObjectType-Article-2 SourceType-Scholarly Journals-1 ObjectType-Feature-1 content type line 23 |
ISSN: | 0022-2461 1573-4803 |
DOI: | 10.1007/s10853-011-5528-2 |