Dielectric Degradation and Microstructures of Heterogeneous Interfaces in Cofired Multilayer Ceramic Capacitors

The compatibility of electrodes and dielectrics in cofired MLCCs with both Ni and Ag/Pd electrodes was characterised by TEM using tripod polished samples. When analysed by convergent beam electron diffraction (CBED) and EDS, NiO lamellae and P-rich intermediate layers were found in highly accelerate...

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Bibliographic Details
Published inJournal of electroceramics Vol. 14; no. 3; pp. 213 - 220
Main Authors Feng, Qiquan, McConville, Caspar J.
Format Journal Article
LanguageEnglish
Published Dordrecht Springer Nature B.V 01.07.2005
Subjects
Dielectrics
Electrodes
HALT
Manganese
Microstructure
Nickel
Silver
Tripods
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ISSN1385-3449
1573-8663
DOI10.1007/s10832-005-0960-9

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Summary:The compatibility of electrodes and dielectrics in cofired MLCCs with both Ni and Ag/Pd electrodes was characterised by TEM using tripod polished samples. When analysed by convergent beam electron diffraction (CBED) and EDS, NiO lamellae and P-rich intermediate layers were found in highly accelerated life tested (HALT) MLCCs with Ni electrodes. CBED confirmed that the P-rich layers had a Ba4Ti13O30 (B4T13) structures. Oxidised Ni layers containing Mn were also found in the HALT samples. It is believed that Mn ions were reduced by the Ni electrodes, as P-rich and Mn-rich segregated layers were observed in the virginal non-life tested MLCCs. Grains with stacking faults, containing dopants such as Mn, Si, and Mg, had the BaTi4O9 (BT4) structure. No silver diffusion was found in either the BaTiO3 based perovskite lattices or the flux phases in air-fired X7R type MLCCs.
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ISSN:1385-3449
1573-8663
DOI:10.1007/s10832-005-0960-9