Material analysis end-station of the Hyogo-ken beamline at SPring-8

• Published in: Journal of synchrotron radiation Vol. 5; no. 3; pp. 509 - 511
• Main Authors: Kaneyoshi, T., Ishihara, T., Yoshioka, H., Motoyama, M., Fukushima, S., Hayashi, K., Kawai, J., Taniguchi, K., Hayakawa, S., Gohshi, Y.
• Format: Journal Article
• Language: English
• Published: 5 Abbey Square, Chester, Cheshire CH1 2HU, England International Union of Crystallography 01.05.1998
• Subjects: polarized X-ray emission spectroscopy; SPring-8; surface analysis; X-ray diffraction; X-ray fluorescence analysis; X-ray fluorescence holography
• ISSN: 1600-5775; 0909-0495; 1600-5775
• DOI: 10.1107/S0909049598001502

Plans to construct surface‐analysis equipment which will be placed on beamline BL24XU of SPring‐8 are presented. There are three experimental hutches in BL24XU, which are available simultaneously by using diamond monochromators as beam splitters. The purpose of the surface‐analysis equipment is the simultaneous measurement of fluorescent and diffracted X‐rays in grazing‐incidence geometry. The instrument is equipped with a solid‐state detector (SSD) and a flat position‐sensitive proportional counter (PSPC) combined with analysing crystals for X‐ray fluorescence (XRF) analysis. A curved PSPC and the goniometer that mounts the SSD used for XRF are also installed for X‐ray diffraction. X‐ray fluorescence holography and polarized X‐ray emission spectroscopy modes are available, so three‐dimensional images of atomic configurations and also the anisotropic structure of materials will be studied.