Next-generation crossover-free quantum Hall arrays with superconducting interconnections

: This work presents precision measurements of quantized Hall array resistance devices using superconducting, crossover-free and multiple interconnections as well as graphene split contacts. These new techniques successfully eliminate the accumulation of internal resistances and leakage currents tha...

Full description

Saved in:
Bibliographic Details
Published inMetrologia Vol. 56; no. 6; pp. 65002 - 65008
Main Authors Kruskopf, Mattias, Rigosi, Albert F, Panna, Alireza R, Marzano, Martina, Patel, Dinesh, Jin, Hanbyul, Newell, David B, Elmquist, Randolph E
Format Journal Article
LanguageEnglish
Published England IOP Publishing 2019
Subjects
Arrays
Crossovers
epitaxial graphene
Graphene
Interconnections
Leakage current
Measurement
multiple connection
quantized Hall array resistance standards
quantum Hall effect
Quantum physics
split contacts
superconducting contacts
Superconductivity
superconducting contacts
quantized Hall array resistance standards
epitaxial graphene
multiple connection
quantum Hall effect
split contacts
Online AccessGet full text

Cover

More Information
Summary:: This work presents precision measurements of quantized Hall array resistance devices using superconducting, crossover-free and multiple interconnections as well as graphene split contacts. These new techniques successfully eliminate the accumulation of internal resistances and leakage currents that typically occur at interconnections and crossing leads between interconnected devices. As a result, a scalable quantized Hall resistance array is obtained with a nominal value that is as precise and stable as that from single-element quantized Hall resistance standards.
Bibliography:MET-101447.R1
Bureau International des Poids et Mesures
ObjectType-Article-1
SourceType-Scholarly Journals-1
ObjectType-Feature-2
content type line 23
M.K., A.F.R., and R.E.E. developed the EG functionalization process. M.K., A.R.P., M.M., D.P., A.F.R., and H.J. performed transport measurements. M.K. produced the graphene samples and fabricated the devices. The manuscript was written through the contributions of all authors. All authors have given approval to the final version of the manuscript.
Author Contributions
ISSN:0026-1394
1681-7575
DOI:10.1088/1681-7575/ab3ba3