Metamaterial-Engineered Silicon Beam Splitter Fabricated with Deep UV Immersion Lithography

Subwavelength grating (SWG) metamaterials have garnered a great interest for their singular capability to shape the material properties and the propagation of light, allowing the realization of devices with unprecedented performance. However, practical SWG implementations are limited by fabrication...

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Published inNanomaterials (Basel, Switzerland) Vol. 11; no. 11; p. 2949
Main Authors Vakarin, Vladyslav, Melati, Daniele, Dinh, Thi Thuy Duong, Le Roux, Xavier, Kan, Warren Kut King, Dupré, Cécilia, Szelag, Bertrand, Monfray, Stéphane, Boeuf, Frédéric, Cheben, Pavel, Cassan, Eric, Marris-Morini, Delphine, Vivien, Laurent, Alonso-Ramos, Carlos Alberto
Format Journal Article
LanguageEnglish
Published Basel MDPI AG 01.11.2021
MDPI
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Summary:Subwavelength grating (SWG) metamaterials have garnered a great interest for their singular capability to shape the material properties and the propagation of light, allowing the realization of devices with unprecedented performance. However, practical SWG implementations are limited by fabrication constraints, such as minimum feature size, that restrict the available design space or compromise compatibility with high-volume fabrication technologies. Indeed, most successful SWG realizations so far relied on electron-beam lithographic techniques, compromising the scalability of the approach. Here, we report the experimental demonstration of an SWG metamaterial engineered beam splitter fabricated with deep-ultraviolet immersion lithography in a 300-mm silicon-on-insulator technology. The metamaterial beam splitter exhibits high performance over a measured bandwidth exceeding 186 nm centered at 1550 nm. These results open a new route for the development of scalable silicon photonic circuits exploiting flexible metamaterial engineering.
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These authors contributed equally to this work.
Current address: III-V Lab, a Joint Lab of Nokia Bell Labs, Thales Research and Technology and CEA LETI, 91767 Palaiseau, France.
ISSN:2079-4991
2079-4991
DOI:10.3390/nano11112949