Counterfeit Integrated Circuits: A Rising Threat in the Global Semiconductor Supply Chain

• Published in: Proceedings of the IEEE Vol. 102; no. 8; pp. 1207 - 1228
• Main Authors: Guin, Ujjwal, Huang, Ke, DiMase, Daniel, Carulli, John M., Tehranipoor, Mohammad, Makris, Yiorgos
• Format: Journal Article
• Language: English
• Published: New York IEEE 01.08.2014; The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
• Subjects: AC/DC parametric tests; Avoidance; Consumer electronics; Counterfeit; counterfeit integrated circuits (ICs); electrical inspection; Electronic components; Electronic devices; Electronics industry; Globalization; Hardware; hardware security; Integrated circuit modeling; Integrated circuits; machine learning; path-delay test; physical inspection; Semiconductor device measurement; Semiconductor devices; Semiconductors; Supply chain management; Supply chains; hardware security; path-delay test; physical inspection; electrical inspection; AC/DC parametric tests; counterfeit integrated circuits (ICs); machine learning
• ISSN: 0018-9219; 1558-2256
• DOI: 10.1109/JPROC.2014.2332291

As the electronic component supply chain grows more complex due to globalization, with parts coming from a diverse set of suppliers, counterfeit electronics have become a major challenge that calls for immediate solutions. Currently, there are a few standards and programs available that address the testing for such counterfeit parts. However, not enough research has yet addressed the detection and avoidance of all counterfeit parts-recycled, remarked, overproduced, cloned, out-of-spec/defective, and forged documentation-currently infiltrating the electronic component supply chain. Even if they work initially, all these parts may have reduced lifetime and pose reliability risks. In this tutorial, we will provide a review of some of the existing counterfeit detection and avoidance methods. We will also discuss the challenges ahead for implementing these methods, as well as the development of new detection and avoidance mechanisms.