Target Design in SEM-Based Nano-CT and Its Influence on X-ray Imaging

Nano-computed tomography (nano-CT) based on scanning electron microscopy (SEM) is utilized for multimodal material characterization in one instrument. Since SEM-based CT uses geometrical magnification, X-ray targets can be adapted without any further changes to the system. This allows for designing...

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Bibliographic Details
Published inJournal of imaging Vol. 9; no. 8; p. 157
Main Authors Fell, Jonas, Wetzler, Felix, Maisl, Michael, Herrmann, Hans-Georg
Format Journal Article
LanguageEnglish
Published Basel MDPI AG 01.08.2023
MDPI
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Summary:Nano-computed tomography (nano-CT) based on scanning electron microscopy (SEM) is utilized for multimodal material characterization in one instrument. Since SEM-based CT uses geometrical magnification, X-ray targets can be adapted without any further changes to the system. This allows for designing targets with varying geometry and chemical composition to influence the X-ray focal spot, intensity and energy distribution with the aim to enhance the image quality. In this paper, three different target geometries with a varying volume are presented: bulk, foil and needle target. Based on the analyzed electron beam properties and X-ray beam path, the influence of the different target designs on X-ray imaging is investigated. With the obtained information, three targets for different applications are recommended. A platinum (Pt) bulk target tilted by 25° as an optimal combination of high photon flux and spatial resolution is used for fast CT scans and the investigation of high-absorbing or large sample volumes. To image low-absorbing materials, e.g., polymers or organic materials, a target material with a characteristic line energy right above the detector energy threshold is recommended. In the case of the observed system, we used a 30° tilted chromium (Cr) target, leading to a higher image contrast. To reach a maximum spatial resolution of about 100 nm, we recommend a tungsten (W) needle target with a tip diameter of about 100 nm.
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ISSN:2313-433X
2313-433X
DOI:10.3390/jimaging9080157