A simplified correction function for the effect of surface roughness in X-ray powder diffraction

The empirical monoparametric function SR = (θ/90)(S/θ) (where S is the refinable parameter and the angle θ is given in degrees) has been suggested for Rietveld analysis as a practical replacement for the commonly used surface roughness correction functions.

Saved in:
Bibliographic Details
Published inJournal of applied crystallography Vol. 37; no. 6; pp. 1013 - 1014
Main Author Sidey, Vasyl
Format Journal Article
LanguageEnglish
Published 5 Abbey Square, Chester, Cheshire CH1 2HU, England Munksgaard International Publishers 01.12.2004
Blackwell
Blackwell Publishing Ltd
Subjects
Condensed matter: structure, mechanical and thermal properties
correction function
Exact sciences and technology
Interface structure and roughness
Physics
Rietveld analysis
Single-crystal and powder diffraction
Solid surfaces and solid-solid interfaces
Structure of solids and liquids; crystallography
surface roughness
Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties)
X-ray diffraction and scattering
X-ray powder diffraction
Refinement
Theoretical study
Correction factor
XRD
Roughness
Online AccessGet full text

Cover

More Information
Summary:The empirical monoparametric function SR = (θ/90)(S/θ) (where S is the refinable parameter and the angle θ is given in degrees) has been suggested for Rietveld analysis as a practical replacement for the commonly used surface roughness correction functions.
Bibliography:istex:7891F2506E46E6C7CFF61AE033A1AD07F90086BD
ark:/67375/WNG-9V77RJ6D-3
ArticleID:JCRPD5024
ObjectType-Article-2
SourceType-Scholarly Journals-1
ObjectType-Feature-1
content type line 23
ISSN:1600-5767
0021-8898
1600-5767
DOI:10.1107/S002188980402254X