Study by EXAFS of the local structure around Si on silicene deposited on Ag(1 1 0) and Ag(1 1 1) surfaces

The local structure around the silicon atoms of silicene deposited onto Ag(1 1 0) and Ag(1 1 1) has been determined by extended x-ray absorption fine structure spectroscopy at the silicon K-edge. This study shows that silicon atoms are not in a flat honeycomb network locally buckled, but that this s...

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Published inJournal of physics. Condensed matter Vol. 28; no. 7; p. 075002
Main Authors Lagarde, P, Chorro, M, Roy, D, Trcera, N
Format Journal Article
LanguageEnglish
Published England IOP Publishing 24.02.2016
Subjects
Atomic structure
Condensed matter
Deposition
Honeycomb
local structure
Signatures
silicene
Silicon
Silicon substrates
Silver
x-ray spectroscopy
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Summary:The local structure around the silicon atoms of silicene deposited onto Ag(1 1 0) and Ag(1 1 1) has been determined by extended x-ray absorption fine structure spectroscopy at the silicon K-edge. This study shows that silicon atoms are not in a flat honeycomb network locally buckled, but that this structure mimics the double Si(1 1 1)-plane of crystalline silicon with almost the same first and second interatomic distances (2.35 and 3.83 Å) on a regularly buckled geometry. Moreover the results evidence silver atoms at a well-defined distance from the silicon ones, a signature for an interaction between the silicene sheet and silver atoms released from the substrate.
Bibliography:JPCM-105537.R2
ObjectType-Article-1
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ISSN:0953-8984
1361-648X
DOI:10.1088/0953-8984/28/7/075002