Inhomogeneities in acid-catalyzed titania–silica and zirconia–silica xerogels as revealed by small-angle x-ray scattering

The small-angle x-ray scattering (SAXS) technique was used to investigate inhomogeneities on the scale of 10 to 600 Å in acid-catalyzed titania–silica and zirconia–silica xerogels. SAXS of (TiO2)x(SiO2)1−x and (ZrO2)x(SiO2)1−x xerogels with x < 0.1, in which there was no phase separation, showed...

Full description

Saved in:
Bibliographic Details
Published inJournal of materials research Vol. 15; no. 9; pp. 1998 - 2005
Main Authors Mountjoy, G., Rigden, J. S., Anderson, R., Wallidge, G. W., Newport, R. J., Smith, M. E.
Format Journal Article
LanguageEnglish
Published New York, USA Cambridge University Press 01.09.2000
Online AccessGet full text

Cover

Loading…
More Information
Summary:The small-angle x-ray scattering (SAXS) technique was used to investigate inhomogeneities on the scale of 10 to 600 Å in acid-catalyzed titania–silica and zirconia–silica xerogels. SAXS of (TiO2)x(SiO2)1−x and (ZrO2)x(SiO2)1−x xerogels with x < 0.1, in which there was no phase separation, showed the presence of two types of inhomogeneity. For Q < 0.05 Å−1 there was a clear departure from Porod scattering which showed that xerogel powder particle surfaces were rough. For 0.1 < Q < 0.4 Å−1 there was a plateau feature corresponding to micropores within the silica-based network, and this feature changes with heat treatment. SAXS of xerogels with x > 0.3 showed the presence of phase-separated regions of metal oxide, which were initially amorphous and crystallized at higher temperatures. A (TiO2)0.18(SiO2)0.82 xerogel that was not initially phase separated became phase separated after heat treatment at 750 °C due to reduced solubility of Ti in the silica network.
Bibliography:PII:S0884291400069211
ark:/67375/6GQ-565475F1-D
istex:6D5066ADC237FB841D0A9FF0F9C514EC0813EF04
ArticleID:06921
ObjectType-Article-2
SourceType-Scholarly Journals-1
ObjectType-Feature-1
content type line 23
ISSN:0884-2914
2044-5326
DOI:10.1557/JMR.2000.0287