A vacuum ultraviolet ion source (VUV-IS) for iodide–chemical ionization mass spectrometry: a substitute for radioactive ion sources
A new ion source (IS) utilizing vacuum ultraviolet (VUV) light is developed and characterized for use with iodide–chemical ionization mass spectrometers (I−-CIMS). The VUV-IS utilizes a compact krypton lamp that emits light at two wavelengths corresponding to energies of ∼10.030 and 10.641 eV. The V...
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Published in | Atmospheric measurement techniques Vol. 13; no. 7; pp. 3683 - 3696 |
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Main Authors | , , , , , , , |
Format | Journal Article |
Language | English |
Published |
Katlenburg-Lindau
Copernicus GmbH
09.07.2020
Copernicus Publications |
Subjects | |
Online Access | Get full text |
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Summary: | A new ion source (IS) utilizing vacuum ultraviolet (VUV) light is developed and characterized for use with iodide–chemical ionization mass
spectrometers (I−-CIMS). The VUV-IS utilizes a compact krypton lamp that emits light at two wavelengths corresponding to energies of
∼10.030 and 10.641 eV. The VUV light photoionizes either methyl iodide (ionization potential, IP = 9.54 ± 0.02 eV)
or benzene (IP = 9.24378 ± 0.00007 eV) to form cations and photoelectrons. The electrons react with methyl iodide to form
I−, which serves as the reagent ion for the CIMS. The VUV-IS is characterized by measuring the sensitivity of a quadrupole CIMS (Q-CIMS) to
formic acid, molecular chlorine, and nitryl chloride under a variety of flow and pressure conditions. The sensitivity of the Q-CIMS, with the
VUV-IS, reached up to ∼700 Hz pptv−1, with detection limits of less than 1 pptv for a 1 min integration period. The
reliability of the Q-CIMS with a VUV-IS is demonstrated with data from a month-long ground-based field campaign. The VUV-IS is further tested by
operation on a high-resolution time-of-flight CIMS (TOF-CIMS). Sensitivities greater than 25 Hz pptv−1 were obtained for formic acid and
molecular chlorine, which were similar to that obtained with a radioactive source. In addition, the mass spectra from sampling ambient air was
cleaner with the VUV-IS on the TOF-CIMS compared to measurements using a radioactive source. These results demonstrate that the VUV lamp is a viable
substitute for radioactive ion sources on I−-CIMS systems for most applications. In addition, initial tests demonstrate that the VUV-IS can
be extended to other reagent ions by the use of VUV absorbers with low IPs to serve as a source of photoelectrons for high IP electron attachers,
such as SF6-. |
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ISSN: | 1867-8548 1867-1381 1867-8548 |
DOI: | 10.5194/amt-13-3683-2020 |