Thin Film Structure of Triisopropylsilylethynyl-Functionalized Pentacene and Tetraceno[2,3-b]thiophene from Grazing Incidence X-Ray Diffraction

• Published in: Advanced materials (Weinheim) Vol. 23; no. 1; pp. 127 - 131
• Main Authors: Mannsfeld, Stefan C. B., Tang, Ming Lee, Bao, Zhenan
• Format: Journal Article
• Language: English
• Published: Weinheim WILEY-VCH Verlag 04.01.2011; WILEY‐VCH Verlag
• Subjects: Diffraction; Grazing incidence; Molecular Structure; Naphthacenes - chemistry; Organosilicon Compounds - chemistry; Pentacene; Thin films; Thiophenes - chemistry; X-Ray Diffraction; X-rays
• ISSN: 0935-9648; 1521-4095; 1521-4095
• DOI: 10.1002/adma.201003135

The specific molecular arrangement of triisopropylsilylethynyl (TIPS)‐functionalized acenes is widely considered to be the origin of the high performance of TIPS‐pentacene thin film devices. However, detailed information on the molecular packing is so far only available for bulk single crystals, and the molecular packing of TIPS‐functionalized acenes in thin films has not been directly determined to date. A combination of ultrabright synchrotron grazing incidence X‐ray diffraction (GIXD) and crystallographic refinement calculations is utilized to obtain precise information about the molecular packing of two high‐performance TIPS‐functionalized semiconductors, TIPS‐ tetraceno[2,3‐b]thiophene and TIPS‐pentacene, in thin films on silicon oxide.