Influence of line tension on spherical colloidal particles at liquid-vapor interfaces
Atomic force microscopy (AFM) imaging of isolated submicron dodecyltrichlorosilane coated silica spheres, immobilized at the liquid polystyrene- (PS-) air interface at the PS glass transition temperature, T(g), allows for determination of the contact angle θ versus particle radius R. At T(g), all θ...
Saved in:
Published in | Physical review letters Vol. 109; no. 19; p. 196101 |
---|---|
Main Authors | , |
Format | Journal Article |
Language | English |
Published |
United States
07.11.2012
|
Online Access | Get more information |
Cover
Loading…
Summary: | Atomic force microscopy (AFM) imaging of isolated submicron dodecyltrichlorosilane coated silica spheres, immobilized at the liquid polystyrene- (PS-) air interface at the PS glass transition temperature, T(g), allows for determination of the contact angle θ versus particle radius R. At T(g), all θ versus R measurements are well described by the modified Young's equation for a line tension τ = 0.93 nN. The AFM measurements are also consistent with a minimum contact angle θ(min) and minimum radius R(min), below which single isolated silica spheres cannot exist at the PS-air interface. |
---|---|
ISSN: | 1079-7114 |
DOI: | 10.1103/physrevlett.109.196101 |