Predictors of failure of recurrent spontaneous CSF rhinorrhea repair: a prospective cohort study
Background To identify and predict risk factors associated with recurrent spontaneous cerebrospinal fluid (CSF) rhinorrhea, a cohort study included a total of 37 adult patients with spontaneous CSF rhinorrhea were analyzed. Results Over a 2-year period, 37 patients of spontaneous CSF leak with exclu...
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Published in | The Egyptian journal of otolaryngology Vol. 39; no. 1; pp. 133 - 7 |
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Main Authors | , , , , |
Format | Journal Article |
Language | English |
Published |
Berlin/Heidelberg
Springer Berlin Heidelberg
01.12.2023
Springer Springer Nature B.V SpringerOpen |
Subjects | |
Online Access | Get full text |
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Summary: | Background
To identify and predict risk factors associated with recurrent spontaneous cerebrospinal fluid (CSF) rhinorrhea, a cohort study included a total of 37 adult patients with spontaneous CSF rhinorrhea were analyzed.
Results
Over a 2-year period, 37 patients of spontaneous CSF leak with exclusion of other etiologies (traumatic, congenital) were enrolled: primary (non-recurrent) (
n
= 20) and secondary (recurrent) (
n
= 17), where 83.8% were females with an average body mass index (BMI) of 36.4 kg/m
2
. Associated symptoms of high intracranial pressure (ICP) namely, blurred vision and unsteadiness (
P
-value = 0.006 and 0.01, respectively), multiparity (92.3%), and failure to localize the defect (17.6%) contributed to patients having more recurrence. Although the cribriform plate was detected frequently (
n
= 29.4%), they were associated with lower recurrence compared to lateral recess of sphenoid (66.6% vs 20%).
Conclusion
Direct endoscopic visualization and repair of skull base defects achieve a high success rate, but failure is still a possibility especially in spontaneous etiology of leaks. In a multiparous female, with high CSF pressure, lateral sphenoid recess, large size, or unidentified defect, the incidence of recurrence is much higher.
Level of evidence
4 |
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ISSN: | 2090-8539 1012-5574 2090-8539 |
DOI: | 10.1186/s43163-023-00484-2 |