Spectral Interferometric Microscopy for Fast and Broadband Phase Characterization

We introduce a novel interferometric method for fast, broadband and microscopic phase characterization, based on common-path configuration. The method can be implemented by adding a simple optical relay to connect conventional microscope and imaging spectrometer.

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Bibliographic Details
Published in2020 Conference on Lasers and Electro-Optics (CLEO) Vol. 8; no. 16; pp. 1 - 2
Main Authors Michaeli, Lior, Haim, Danielle Ben, Suchowski, Haim, Ellenbogen, Tal
Format Conference Proceeding Journal Article
LanguageEnglish
Published Weinheim OSA 01.08.2020
Wiley Subscription Services, Inc
Subjects
Broadband
Broadband communication
Heterostructures
Image acquisition
interferometers
Liquid crystals
Materials science
Metamaterials
metasurfaces
Microscopy
optical characterization
Optical interferometry
Optical materials
Optical microscopy
Optical properties
Optical reflection
Optical refraction
Optical variables control
Optics
Phase transitions
Physical properties
real‐time dynamics
Reflection
Spectra
Two dimensional materials
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Summary:We introduce a novel interferometric method for fast, broadband and microscopic phase characterization, based on common-path configuration. The method can be implemented by adding a simple optical relay to connect conventional microscope and imaging spectrometer.
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ISSN:2195-1071
2195-1071
DOI:10.1002/adom.202000326