The method of fundamental solutions for complex electrical impedance tomography

The forward problem for complex electrical impedance tomography (EIT) is solved by means of a meshless method, namely the method of fundamental solutions (MFS). The MFS for the complex EIT direct problem is numerically implemented, and its efficiency and accuracy as well as the numerical convergence...

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Bibliographic Details
Published inEngineering analysis with boundary elements Vol. 46; pp. 126 - 139
Main Authors Heravi, Marjan Asadzadeh, Marin, Liviu, Sebu, Cristiana
Format Journal Article
LanguageEnglish
Published Elsevier Ltd 01.09.2014
Subjects
Boundary element method
Convergence
Electrical impedance
Electrical impedance tomography (EIT)
Finite element method
Forward problem
Mathematical analysis
Mathematical models
Meshless method
Method of fundamental solutions (MFS)
Multi-frequency
Physical properties
Tomography
Method of fundamental solutions (MFS)
Multi-frequency
Forward problem
Electrical impedance tomography (EIT)
Meshless method
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Summary:The forward problem for complex electrical impedance tomography (EIT) is solved by means of a meshless method, namely the method of fundamental solutions (MFS). The MFS for the complex EIT direct problem is numerically implemented, and its efficiency and accuracy as well as the numerical convergence of the MFS solution are analysed when assuming the presence in the medium (i.e. background) of one or two inclusions with the physical properties different from those corresponding to the background. Four numerical examples with inclusion(s) of various convex and non-convex smooth shapes (e.g. circular, elliptic, peanut-shaped and acorn-shaped) and sizes are presented and thoroughly investigated.
Bibliography:ObjectType-Article-1
SourceType-Scholarly Journals-1
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content type line 23
ISSN:0955-7997
1873-197X
DOI:10.1016/j.enganabound.2014.04.022