Geometric Aberration Theory of Offner Imaging Spectrometers

A third-order aberration theory has been developed for the Offner imaging spectrometer comprising an extended source; two concave mirrors; a convex diffraction grating; and an image plane. Analytic formulas of the spot diagram are derived for tracing rays through the system based on Fermat’s princip...

Full description

Saved in:
Bibliographic Details
Published inSensors (Basel, Switzerland) Vol. 19; no. 18; p. 4046
Main Authors Zhao, Meihong, Jiang, Yanxiu, Yang, Shuo, Li, Wenhao
Format Journal Article
LanguageEnglish
Published Basel MDPI AG 19.09.2019
MDPI
Subjects
Aberration
aberration theory
Astigmatism
convex grating
Coordinate transformations
Design
Gratings (spectra)
Imaging spectrometers
Methods
Mirrors
Offner imaging spectrometer
Optics
Ray tracing
Software
Spectrometers
spot diagrams
United States > US
China
Online AccessGet full text

Cover

More Information
Summary:A third-order aberration theory has been developed for the Offner imaging spectrometer comprising an extended source; two concave mirrors; a convex diffraction grating; and an image plane. Analytic formulas of the spot diagram are derived for tracing rays through the system based on Fermat’s principle. The proposed theory can be used to discuss in detail individual aberrations of the system such as coma, spherical aberration and astigmatism, and distortion together with the focal conditions. It has been critically evaluated as well in a comparison with exact ray tracing constructed using the commercial software ZEMAX. In regard to the analytic formulas, the results show a high degree of practicality.
Bibliography:ObjectType-Article-1
SourceType-Scholarly Journals-1
ObjectType-Feature-2
content type line 23
ISSN:1424-8220
1424-8220
DOI:10.3390/s19184046