Study on transient photocurrent induced by energy level defect of schottky diode irradiated by high power pulsed laser

• Published in: Scientific reports Vol. 13; no. 1; p. 14487
• Main Authors: Wang, Y. H., Su, J. H., Wang, T. W., Lei, Z. Y., Chen, Z. J., Shangguan, S. P., Han, J. W., Ma, Y. Q.
• Format: Journal Article
• Language: English
• Published: London Nature Publishing Group 02.09.2023; Nature Publishing Group UK; Nature Portfolio
• Subjects: Electrons; High temperature; Recombination
• ISSN: 2045-2322; 2045-2322
• DOI: 10.1038/s41598-023-40983-z

Abstract The transient photocurrent is one of the key parameters of the spatial radiation effect of photoelectric devices, and the energy level defect affects the transient photocurrent. In this paper, by studying the deep level transient spectrum of a self-designed Schottky diode, the defect properties of the interface region of the anode metal AlCu and Si caused by high-temperature annealing at 150 ℃, 200 ℃ and 300 ℃ for 1200 h have been quantitatively analyzed. The study shows that the defect is located at the position of + 0.41 eV on the valence band, the concentration is 2.8  $$\times$$ ×  10 13 /cm 2 , and the capture cross section is $$\sigma$$ σ  = 8.5  $$\times$$ ×  10 17 . The impurity energy level mainly comes from the diffusion of Al atom in anode metal. We found that the defect did not cause the electrical performance degradation and obvious morphology change of the device, but the transient photocurrent increased significantly. The reason is that the high temperature treatment results in a growth in the density of states at the interface between AlCu–Si. The more mismatched dislocations and recombination center increased the reverse current of the heterojunction. The above view is proved by the TCAD simulation test.