Phase imaging with intermodulation atomic force microscopy

Intermodulation atomic force microscopy (IMAFM) is a dynamic mode of atomic force microscopy (AFM) with two-tone excitation. The oscillating AFM cantilever in close proximity to a surface experiences the nonlinear tip-sample force which mixes the drive tones and generates new frequency components in...

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Bibliographic Details
Published inUltramicroscopy Vol. 110; no. 6; pp. 573 - 577
Main Authors Platz, Daniel, Tholén, Erik A., Hutter, Carsten, von Bieren, Arndt C., Haviland, David B.
Format Journal Article
LanguageEnglish
Published Netherlands Elsevier B.V 01.05.2010
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Summary:Intermodulation atomic force microscopy (IMAFM) is a dynamic mode of atomic force microscopy (AFM) with two-tone excitation. The oscillating AFM cantilever in close proximity to a surface experiences the nonlinear tip-sample force which mixes the drive tones and generates new frequency components in the cantilever response known as intermodulation products (IMPs). We present a procedure for extracting the phase at each IMP and demonstrate phase images made by recording this phase while scanning. Amplitude and phase images at intermodulation frequencies exhibit enhanced topographic and material contrast.
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ISSN:0304-3991
1879-2723
1879-2723
DOI:10.1016/j.ultramic.2010.02.012