嘉晃, 安., 雅英, 伊., Takashi, E., Yoshiaki, Y., Shuichi, M., Masahide, I., & Toyohiko, Y. (2005). Profilometry with line-field Fourier-domain interferometry. Optics Express, 13(3), 695-701. https://doi.org/10.1364/opex.13.000695
Chicago Style (17th ed.) Citation嘉晃, 安野, 伊藤 雅英, Endo Takashi, Yasuno Yoshiaki, Makita Shuichi, Itoh Masahide, and Yatagai Toyohiko. "Profilometry with Line-field Fourier-domain Interferometry." Optics Express 13, no. 3 (2005): 695-701. https://doi.org/10.1364/opex.13.000695.
MLA (9th ed.) Citation嘉晃, 安野, et al. "Profilometry with Line-field Fourier-domain Interferometry." Optics Express, vol. 13, no. 3, 2005, pp. 695-701, https://doi.org/10.1364/opex.13.000695.
Warning: These citations may not always be 100% accurate.