On the performance of VSI Shewhart control chart for monitoring the coefficient of variation in the presence of measurement errors

• Published in: International journal of advanced manufacturing technology Vol. 104; no. 1-4; pp. 211 - 243
• Main Authors: Nguyen, Huu Du, Nguyen, Quoc Thong, Tran, Kim Phuc, Ho, Dang Phuc
• Format: Journal Article
• Language: English
• Published: London Springer London 01.09.2019; Springer Nature B.V; Springer Verlag
• Subjects: Applications; CAE) and Design; Coefficient of variation; Computer Science; Computer simulation; Computer-Aided Engineering (CAD; Control charts; Economic models; Engineering; Error analysis; Industrial and Production Engineering; Mathematical analysis; Mathematical models; Mathematics; Mechanical Engineering; Media Management; Modeling and Simulation; Monitoring; Original Article; Statistics; Systems and Control; Measurement errors; Coefficient of variation; VSI control chart
• ISSN: 0268-3768; 1433-3015
• DOI: 10.1007/s00170-019-03352-7

In this paper, we propose a variable sampling interval Shewhart control chart to monitor the coefficient of variation (CV) squared, denoted by VSI SH- γ 2 . The new model overcomes the ARL-biased (average run length) property of the control chart monitoring the CV in a previous study by designing two one-sided charts rather than one two-sided chart. Moreover, the effect of measurement error on the performance of the VSI SH- γ 2 control chart is investigated. The incorrect formula for the distribution of the CV in the presence of measurement error in a former study is fixed. Numerical simulations show that the precision errors and accuracy errors do have negative influences on the VSI SH- γ 2 chart. An appropriate strategy based on the obtained results is suggested to reduce these negative effects.