Scalable and CMOS compatible silicon photonic physical unclonable functions for supply chain assurance
Abstract We demonstrate the uniqueness, unclonability and secure authentication of N = 56 physical unclonable functions (PUFs) realized from silicon photonic moiré quasicrystal interferometers. Compared to prior photonic-PUF demonstrations typically limited in scale to only a handful of unique devi...
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Published in | Scientific reports Vol. 12; no. 1; p. 15653 |
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Main Authors | , , , |
Format | Journal Article |
Language | English |
Published |
London
Nature Publishing Group
19.09.2022
Nature Publishing Group UK Nature Portfolio |
Subjects | |
Online Access | Get full text |
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Summary: | Abstract
We demonstrate the uniqueness, unclonability and secure authentication of
N
= 56 physical unclonable functions (PUFs) realized from silicon photonic moiré quasicrystal interferometers. Compared to prior photonic-PUF demonstrations typically limited in scale to only a handful of unique devices and on the order of 10 false authentication attempts, this work examines > 10
3
inter-device comparisons and false authentication attempts. Device fabrication is divided across two separate fabrication facilities, allowing for cross-fab analysis and emulation of a malicious foundry with exact knowledge of the PUF photonic circuit design and process. Our analysis also compares cross-correlation based authentication to the traditional Hamming distance method and experimentally demonstrates an authentication error rate AER = 0%, false authentication rate FAR = 0%, and an estimated probability of cloning below 10
−30
. This work validates the potential scalability of integrated photonic-PUFs which can attractively leverage mature wafer-scale manufacturing and automated contact-free optical probing. Such structures show promise for authenticating hardware in the untrusted supply chain or augmenting conventional electronic-PUFs to enhance system security. |
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Bibliography: | ObjectType-Article-1 SourceType-Scholarly Journals-1 ObjectType-Feature-2 content type line 23 |
ISSN: | 2045-2322 2045-2322 |
DOI: | 10.1038/s41598-022-19796-z |