Design and Fabrication of a Push-Pull Electrostatic Actuated Cantilever Waveguide Scanner

• Published in: Micromachines (Basel) Vol. 10; no. 7; p. 432
• Main Authors: Wang, Wei-Chih, Gu, Kebin, Tsui, ChiLeung
• Format: Journal Article
• Language: English
• Published: Switzerland MDPI AG 29.06.2019; MDPI
• Subjects: Actuators; Broadband; cantilever waveguide; Design; electrostatic actuator; Field of view; Focal plane; Frequency shift; Geometry; Horizontal orientation; non-resonating scanner; optical scanner; Principles; push-pull actuator; Residual stress; rib waveguide; Scanners; Scanning; Single mode operation; Transmission efficiency; Waveguides; United States > US; optical scanner; rib waveguide; non-resonating scanner; push-pull actuator; cantilever waveguide; electrostatic actuator
• ISSN: 2072-666X; 2072-666X
• DOI: 10.3390/mi10070432

The paper presents a novel fully integrated MEMS-based non-resonating operated 2D mechanical scanning system using a 1D push-pull actuator. Details of the design, fabrication and tests performed are presented. The current design utilizes an integrated electrostatic push-pull actuator and a SU-8 rib waveguide with a large core cross section (4 μm in height and 20 μm in width) in broadband single mode operation (λ = 0.4 μm to 0.65 μm). We have successfully demonstrated a 2D scanning motion using non- resonating operation with 201Hz in vertical direction and 20 Hz in horizontal direction. This non-resonating scanner system has achieved a field of view (FOV) of 0.019 to 0.072 radians in vertical and horizontal directions, with the advantage of overcoming its frequency shift caused by fabrication uncertainties. In addition, we observed two fundamental resonances at 201 and 536 Hz in the vertical and horizontal directions with corresponding displacements of 130 and 19 μm, or 0.072 and 0.0105 radian field of view operating at a +150 V input. A gradient index (GRIN) lens is placed at the end of the waveguide to focus the diverging beam output from the waveguide and a 20 μm beam diameter is observed at the focal plane. The transmission efficiency of the waveguide is slightly low (~10%) and slight tensile residual stress can be observed at the cantilever portion of the waveguide due to inherent imperfections in the fabrication process.