Sketch-Based Image Retrieval: Benchmark and Bag-of-Features Descriptors
We introduce a benchmark for evaluating the performance of large-scale sketch-based image retrieval systems. The necessary data are acquired in a controlled user study where subjects rate how well given sketch/image pairs match. We suggest how to use the data for evaluating the performance of sketch...
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Published in | IEEE transactions on visualization and computer graphics Vol. 17; no. 11; pp. 1624 - 1636 |
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Main Authors | , , , |
Format | Journal Article |
Language | English |
Published |
United States
IEEE
01.11.2011
The Institute of Electrical and Electronics Engineers, Inc. (IEEE) Institute of Electrical and Electronics Engineers |
Subjects | |
Online Access | Get full text |
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Summary: | We introduce a benchmark for evaluating the performance of large-scale sketch-based image retrieval systems. The necessary data are acquired in a controlled user study where subjects rate how well given sketch/image pairs match. We suggest how to use the data for evaluating the performance of sketch-based image retrieval systems. The benchmark data as well as the large image database are made publicly available for further studies of this type. Furthermore, we develop new descriptors based on the bag-of-features approach and use the benchmark to demonstrate that they significantly outperform other descriptors in the literature. |
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Bibliography: | ObjectType-Article-1 SourceType-Scholarly Journals-1 ObjectType-Feature-2 content type line 14 content type line 23 ObjectType-Article-2 ObjectType-Feature-1 |
ISSN: | 1077-2626 1941-0506 1941-0506 |
DOI: | 10.1109/TVCG.2010.266 |