Single-Wedge Lift-Out for Atom Probe Tomography Al/Ni Multilayers Specimen Preparation Based on Dual-Beam-FIB

• Published in: Micromachines (Basel) Vol. 13; no. 1; p. 35
• Main Authors: Qiao, Yi, Zhao, Yalong, Zhang, Zheng, Liu, Binbin, Li, Fusheng, Tong, Huan, Wu, Jintong, Zhou, Zhanqi, Xu, Zongwei, Zhang, Yue
• Format: Journal Article
• Language: English
• Published: Switzerland MDPI AG 27.12.2021; MDPI
• Subjects: Al/Ni multilayers; Aluminum; atom probe tomography (APT); Composite materials; Crystal structure; Field emission microscopy; focused ion beam (FIB); Interdiffusion; Interfaces; Ion beams; Ion implantation; lift-out; Multilayers; Nickel; Phase transitions; R&D; Research & development; single-wedge; Specimen preparation; Tomography; Al/Ni multilayers; lift-out; single-wedge; atom probe tomography (APT); focused ion beam (FIB)
• ISSN: 2072-666X; 2072-666X
• DOI: 10.3390/mi13010035

Atomic probe tomography (APT) samples with Al/Ni multilayer structure were successfully prepared by using a focused ion beam (FIB), combining with a field emission scanning electron microscope, with a new single-wedge lift-out method and a reduced amorphous damage layer of Ga ions implantation. The optimum vertex angle and preparation parameters of APT sample were discussed. The double interdiffusion relationship of the multilayer films was successfully observed by the local electrode APT, which laid a foundation for further study of the interface composition and crystal structure of the two-phase composites.