In situ etching-back processes for a sharper top interface in boron delta-doped diamond structures

One of the main challenges of delta-doping of diamond with boron resides in minimizing the width and optimizing the structural quality of the interface region between the heavily-doped ultra-thin layer and the non intentionally doped high mobility epilayers. In this work, we present an in situ etchi...

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Published inDiamond and related materials Vol. 24; pp. 175 - 178
Main Authors Fiori, Alexandre, Tran Thi, Thu Nhi, Chicot, Gauthier, Jomard, François, Omnès, Franck, Gheeraert, Etienne, Bustarret, Etienne
Format Journal Article
LanguageEnglish
Published Amsterdam Elsevier B.V 01.04.2012
Elsevier
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Summary:One of the main challenges of delta-doping of diamond with boron resides in minimizing the width and optimizing the structural quality of the interface region between the heavily-doped ultra-thin layer and the non intentionally doped high mobility epilayers. In this work, we present an in situ etching-back approach to this problem. In particular, a careful SIMS profiling of the top interface shows that advanced gas switching procedures and adequate in situ O2 and H2 plasma etch steps lead to a rising depth lower than 2nm per decade over 3 to 4 orders of magnitude of boron concentration. A specificity of the present work is that the multilayer structures were obtained without interrupting the microwave plasma during the whole process. ► Challenge of delta-doping of diamond is in reducing width and optimizing interfaces. ► Smart gas switching and in situ O2 and H2 plasma steps make sharp and thin interfaces. ► Multilayer structures were grown without plasma interruption during the process.
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ISSN:0925-9635
1879-0062
DOI:10.1016/j.diamond.2012.01.018