In situ etching-back processes for a sharper top interface in boron delta-doped diamond structures
One of the main challenges of delta-doping of diamond with boron resides in minimizing the width and optimizing the structural quality of the interface region between the heavily-doped ultra-thin layer and the non intentionally doped high mobility epilayers. In this work, we present an in situ etchi...
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Published in | Diamond and related materials Vol. 24; pp. 175 - 178 |
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Main Authors | , , , , , , |
Format | Journal Article |
Language | English |
Published |
Amsterdam
Elsevier B.V
01.04.2012
Elsevier |
Subjects | |
Online Access | Get full text |
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Summary: | One of the main challenges of delta-doping of diamond with boron resides in minimizing the width and optimizing the structural quality of the interface region between the heavily-doped ultra-thin layer and the non intentionally doped high mobility epilayers. In this work, we present an in situ etching-back approach to this problem. In particular, a careful SIMS profiling of the top interface shows that advanced gas switching procedures and adequate in situ O2 and H2 plasma etch steps lead to a rising depth lower than 2nm per decade over 3 to 4 orders of magnitude of boron concentration. A specificity of the present work is that the multilayer structures were obtained without interrupting the microwave plasma during the whole process.
► Challenge of delta-doping of diamond is in reducing width and optimizing interfaces. ► Smart gas switching and in situ O2 and H2 plasma steps make sharp and thin interfaces. ► Multilayer structures were grown without plasma interruption during the process. |
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Bibliography: | ObjectType-Article-2 SourceType-Scholarly Journals-1 ObjectType-Feature-1 content type line 23 |
ISSN: | 0925-9635 1879-0062 |
DOI: | 10.1016/j.diamond.2012.01.018 |