Research of a novel temperature adaptive gate driver for power metal-oxide semiconductor

• Published in: IET power electronics Vol. 6; no. 2; pp. 404 - 416
• Main Authors: Hua-long, Zhuang, Guo-huan, Hua, Shen, Xu, Wei-feng, Sun, Zhi-qun, Li
• Format: Journal Article
• Language: English
• Published: Stevenage The Institution of Engineering and Technology 01.02.2013; The Institution of Engineering & Technology
• Subjects: AC–DC converter; AC‐DC power convertors; BCD process technology; BIMOS integrated circuits; Circuits; driver circuits; electromagnetic interferences; Gates; low‐power electronics; Metal oxide semiconductors; Metal oxides; Power consumption; power metal‐oxide semiconductor field effect transistor; power MOSFET; Semiconductors; size 0.25 mum; switched mode power supplies; switched mode power supply; Switching; switching losses; temperature adaptive gate driver; Temperature compensation; temperature compensation technique; total power losses; turn‐off loss; turn‐on loss; voltage 40 V; turn-on loss; size 0.25 mum; switched mode power supplies; voltage 40 V; driver circuits; power MOSFET; voltage; AC–DC converter; temperature adaptive gate driver; size; switched mode power supply; electromagnetic interferences; total power losses; temperature compensation technique; BIMOS integrated circuits; power metal-oxide semiconductor field effect transistor; AC-DC power convertors; turn-off loss; low-power electronics; BCD process technology; switching losses
• ISSN: 1755-4535; 1755-4543; 1755-4543
• DOI: 10.1049/iet-pel.2012.0279

Driving power metal-oxide semiconductor field-effect transistor at high frequency may induce significant switching losses, which have a great proportion in total power losses. Especially in the case of higher temperature, switching losses increased tangibly. A novel temperature adaptive gate driver with low power consumption in a high-temperature environment is proposed for switched-mode power supply by the temperature compensation technique. It has been realised to decrease the switching losses in wide scope temperature, and cannot sacrifice performance of the electromagnetic interferences, by regulating di/dt and dv/dt of switching curve in high temperature. A 0.25 μm, 40 V bipolar-CMOS-DMOS (BCD) process technology is utilised and experimental circuits and results are then presented. Compared with the conventional gate driver, the turn-on loss and turn-off loss of the temperature adaptive gate driver can be reduced, respectively, by 17% and 22%. At present, it has been used in an AC–DC converter to improve work efficiency.