Design and Modeling of a High-Speed AFM-Scanner

• Published in: IEEE transactions on control systems technology Vol. 15; no. 5; pp. 906 - 915
• Main Authors: Schitter, G., Astrom, K.J., DeMartini, B.E., Thurner, P.J., Turner, K.L., Hansma, P.K.
• Format: Journal Article
• Language: English
• Published: New York IEEE 01.09.2007; The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
• Subjects: Atomic force microscopy; Bandwidth; Biological control systems; Calibration; Control Engineering; Design engineering; Design parameters; Electrical Engineering, Electronic Engineering, Information Engineering; Elektroteknik och elektronik; Engineering and Technology; fast scanning; Force control; High speed; Imaging; Mathematical model; Mathematical models; mechatronics; nanotechnology; Pi control; precision positioning; Proportional control; real time imaging; Reglerteknik; Resonance; Resonant frequency; Scanners; Teknik
• ISSN: 1063-6536; 1558-0865; 1558-0865
• DOI: 10.1109/TCST.2007.902953

A new mechanical scanner design for a high-speed atomic force microscope (AFM) is presented and discussed in terms of modeling and control. The positioning range of this scanner is 13 mum in the X- and Y-directions and 4.3 mum in the vertical direction. The lowest resonance frequency of this scanner is above 22 kHz. This paper is focused on the vertical direction of the scanner, being the crucial axis of motion with the highest precision and bandwidth requirements for gentle imaging with the AFM. A second- and a fourth-order mathematical model of the scanner are derived that allow new insights into important design parameters. Proportional-integral (Pl)-feedback control of the high-speed scanner is discussed and the performance of the new AFM is demonstrated by imaging a calibration grating and a biological sample at 8 frames/s.