Distribution of lattice-strain on partly nitrogen-covered Cu(0 0 1) surfaces

• Published in: Surface science Vol. 547; no. 3; pp. L871 - L876
• Main Authors: Ohno, Shin-ya, Yagyuu, Kazuma, Nakatsuji, Kan, Komori, Fumio
• Format: Journal Article
• Language: English
• Published: Lausanne Elsevier B.V 20.12.2003; Amsterdam Elsevier Science; New York, NY
• Subjects: Composition; defects and impurities; Condensed matter: structure, mechanical and thermal properties; Copper; Exact sciences and technology; Nitrogen atom; Physics; Scanning tunneling microscopy; Solid surfaces and solid-solid interfaces; Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties); Copper; Scanning tunneling microscopy; Nitrogen atom; Patterning; Lattice distortion; Surface defect; Transition elements; Crystal faces; Elastic deformation; Experimental study; Protrusion
• ISSN: 0039-6028; 1879-2758
• DOI: 10.1016/j.susc.2003.10.025

In-plane elastic lattice strain on the Cu(0 0 1)–c(2 × 2)N surfaces is investigated by scanning tunneling microscopy on the surface where nitrogen-adsorbed patches with average size of 5 × 5 nm 2 (c(2 × 2)N patches) are well separated by wide clean Cu surface. The lattice distortion on clean Cu surface is recognized in the vicinity of the boundary to a c(2 × 2)N patch. The positions of the protrusions observed on the c(2 × 2)N patch are compared with the surrounding undistorted (1 × 1) lattice of the clean Cu surface. Most of the protrusions on the c(2 × 2)N patches locate on the fourfold hollow sites of the undistorted Cu lattice. The lattice distortion is significant only near the boundary to the surrounding clean Cu surface.