Locking Multi-Laser Frequencies to a Precision Wavelength Meter: Application to Cold Atoms

We herein report a simultaneous frequency stabilization of two 780-nm external cavity diode lasers using a precision wavelength meter (WLM). The laser lock performance is characterized by the Allan deviation measurement in which we find σy=10-12 at an averaging time of 1000 s. We also obtain spectra...

Full description

Saved in:
Bibliographic Details
Published inSensors (Basel, Switzerland) Vol. 21; no. 18; p. 6255
Main Authors Kim, Junwoo, Kim, Keumhyun, Lee, Dowon, Shin, Yongha, Kang, Sungsam, Kim, Jung-Ryul, Choi, Youngwoon, An, Kyungwon, Lee, Moonjoo
Format Journal Article
LanguageEnglish
Published Switzerland MDPI AG 18.09.2021
MDPI
Subjects
Bandwidths
Cold atoms
Communication
Digitization
external cavity diode laser
Flicker
Frequency drift
Frequency stabilization
Laser cooling
laser frequency stabilization
Laser stability
Lasers
Locking
Noise
Optical traps
Semiconductor lasers
Spectrum analysis
Standard deviation
wavelength meter
wavelength meter
external cavity diode laser
laser frequency stabilization
Online AccessGet full text

Cover

More Information
Summary:We herein report a simultaneous frequency stabilization of two 780-nm external cavity diode lasers using a precision wavelength meter (WLM). The laser lock performance is characterized by the Allan deviation measurement in which we find σy=10-12 at an averaging time of 1000 s. We also obtain spectral profiles through a heterodyne spectroscopy, identifying the contribution of white and flicker noises to the laser linewidth. The frequency drift of the WLM is measured to be about 2.0(4) MHz over 36 h. Utilizing the two lasers as a cooling and repumping field, we demonstrate a magneto-optical trap of 87Rb atoms near a high-finesse optical cavity. Our laser stabilization technique operates at broad wavelength range without a radio frequency element.
Bibliography:ObjectType-Article-1
SourceType-Scholarly Journals-1
ObjectType-Feature-2
content type line 23
These authors contributed equally to this work.
ISSN:1424-8220
1424-8220
DOI:10.3390/s21186255