Estimation of Nonlinear Errors-in-Variables Models for Computer Vision Applications

In an errors-in-variables (EIV) model, all the measurements are corrupted by noise. The class of EIV models with constraints separable into the product of two nonlinear functions, one solely in the variables and one solely in the parameters, is general enough to represent most computer vision proble...

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Bibliographic Details
Published inIEEE transactions on pattern analysis and machine intelligence Vol. 28; no. 10; pp. 1537 - 1552
Main Authors Matei, B.C., Meer, P.
Format Journal Article
LanguageEnglish
Published Los Alamitos, CA IEEE 01.10.2006
IEEE Computer Society
The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
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Summary:In an errors-in-variables (EIV) model, all the measurements are corrupted by noise. The class of EIV models with constraints separable into the product of two nonlinear functions, one solely in the variables and one solely in the parameters, is general enough to represent most computer vision problems. We show that the estimation of such nonlinear EIV models can be reduced to iteratively estimating a linear model having point dependent, i.e., heteroscedastic, noise process. Particular cases of the proposed heteroscedastic errors-in-variables (HEIV) estimator are related to other techniques described in the vision literature: the Sampson method, renormalization, and the fundamental numerical scheme. In a wide variety of tasks, the HEIV estimator exhibits the same, or superior, performance as these techniques and has a weaker dependence on the quality of the initial solution than the Levenberg-Marquardt method, the standard approach toward estimating nonlinear models
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ISSN:0162-8828
1939-3539
2160-9292
DOI:10.1109/TPAMI.2006.205