Te L-subshell x-ray emission induced by lower energy H2+ ions

The L-shell x-ray emission of tellurium induced by H 2 + ions impact is investigated in an energy range of 150–300 keV. The blue shifts of various L-subshell x rays and the enhancement of the relative intensity ratios of Lι, Lβ to Lα x ray are observed and interpreted by the multiple ionization of o...

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Published inScientific reports Vol. 14; no. 1; pp. 28944 - 11
Main Authors Wei, Jing, Zhou, Xianming, Cheng, Rui, Zhang, Yanning, Zhang, Xiaoan, Zhao, Yongtao
Format Journal Article
LanguageEnglish
Published London Nature Publishing Group UK 22.11.2024
Nature Publishing Group
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Summary:The L-shell x-ray emission of tellurium induced by H 2 + ions impact is investigated in an energy range of 150–300 keV. The blue shifts of various L-subshell x rays and the enhancement of the relative intensity ratios of Lι, Lβ to Lα x ray are observed and interpreted by the multiple ionization of outer-shell electrons. The new experimental x-ray production cross sections, which almost correspond to those of protons with half of the original energy, are extracted and compared with various theoretical estimations. The correction effects of the united atom approximation and the multiple ionization atomic parameters are compared, and the influence of atomic parameters from different databases on the simulations is discussed. Overall, the ECUSAR-MI calculations using theoretical atomic parameters present the best agreement with the experiment results.
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ISSN:2045-2322
2045-2322
DOI:10.1038/s41598-024-80191-x