Persistence of Septal Defects After Transeptal Puncture for Pulmonary Vein Isolation Procedures

Pulmonary vein isolation (PVI) is widely practiced as a means of potentially curing atrial fibrillation (AF). Transeptal puncture is performed for PVI procedures, often two such punctures are performed. We sought to examine the prevalence of medium‐ to long‐ term iatrogenic septal defects after such...

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Published inPacing and clinical electrophysiology Vol. 27; no. 10; pp. 1411 - 1414
Main Authors OBEL, OWEN, MANSOUR, MOUSSA, PICARD, MICHAEL, RUSKIN, JEREMY, KEANE, DAVID
Format Journal Article
LanguageEnglish
Published 350 Main Street , Malden , MA 02148-5018 , USA and 9600 Garsington Road , Oxford OX4 2DQ , UK Blackwell Science Inc 01.10.2004
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Summary:Pulmonary vein isolation (PVI) is widely practiced as a means of potentially curing atrial fibrillation (AF). Transeptal puncture is performed for PVI procedures, often two such punctures are performed. We sought to examine the prevalence of medium‐ to long‐ term iatrogenic septal defects after such procedures. Thirty‐one patients who were undergoing their second PVI procedure were studied with transesophageal echocardiography (TEE) with two‐dimensional imaging and color Doppler, examining the fossa ovalis for defects. Mean time from the original PVI to the time of TEE was 35 weeks. Two patients were discovered to have iatrogenic septal defects. The interval between the first PVI procedure and the TEE showing a septal defect was 33.7 weeks in one patient and 14.3 weeks in the other. Iatrogenic septal defects may occur in the medium‐ to long‐term in patients undergoing PVI procedures for AF. The clinical implications of such defects are unknown.
Bibliography:ark:/67375/WNG-FGVMCCV6-B
istex:0A0FAA9F686FADE7CF78DFCC7F9D056386979635
ArticleID:PACE646
ObjectType-Article-1
SourceType-Scholarly Journals-1
ObjectType-Feature-2
content type line 23
ISSN:0147-8389
1540-8159
DOI:10.1111/j.1540-8159.2004.00646.x