Higuchi’s fractal dimension for analysis of the effect of external periodic stressor on electrical oscillations in the brain

This study addresses application of Higuchi’s fractal dimension (FD) as a measure to evaluate the effect of external periodic stressor on electrical oscillations in the brain. Modulated microwave radiation was applied as a weak periodic stressor with strongly inhomogeneous distribution inside the br...

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Published inMedical & biological engineering & computing Vol. 49; no. 5; pp. 585 - 591
Main Authors Hinrikus, Hiie, Bachmann, Maie, Karai, Deniss, Klonowski, Włodzimierz, Lass, Jaanus, Stepien, Pavel, Stepien, Robert, Tuulik, Viiu
Format Journal Article
LanguageEnglish
Published Berlin/Heidelberg Springer-Verlag 01.05.2011
Springer Nature B.V
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Summary:This study addresses application of Higuchi’s fractal dimension (FD) as a measure to evaluate the effect of external periodic stressor on electrical oscillations in the brain. Modulated microwave radiation was applied as a weak periodic stressor with strongly inhomogeneous distribution inside the brain. Experiments were performed on a group of 14 volunteers. Ten cycles (1 min on, 1 min off) of 450-MHz microwave radiation modulated at 40 Hz were applied. Higuchi’s FD was calculated in eight symmetric electroencephalographic (EEG) channels located in frontal, temporal, parietal, and occipital areas. FD values averaged over a group detected a small (1–2%) but statistically significant increase with exposure in all EEG channels. FD increased for 12, decreased for one, and was constant for one subject. FD showed the most remarkable effect in temporal and parietal regions of the left hemisphere where the microwave field was maximal. Changes of FD in these regions of the right hemisphere were much higher than expected in accordance with the field distribution. Correlation of FD between different EEG channels was high and retained its value in exposed conditions. Spreading of disturbance between different brain areas is supposed to be crucial for the effect of exposure on the electrical oscillations in the brain.
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ISSN:0140-0118
1741-0444
1741-0444
DOI:10.1007/s11517-011-0768-5