Investigations of electrical trees in the inner layer of XLPE cable insulation using computer-aided image recording monitoring

• Published in: IEEE transactions on dielectrics and electrical insulation Vol. 17; no. 3; pp. 685 - 693
• Main Authors: Ansheng Xie, Xiaoquan Zheng, Shengtao Li, Chen, George
• Format: Journal Article
• Language: English
• Published: New York IEEE 01.06.2010; The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
• Subjects: Amorphous materials; Cable insulation; Cables; Computerized monitoring; Cross-linked polyethylene; Cross-linked polyethylene cable insulation; Dielectrics; electrical trees; Electrodes; Fractals; Frequency; High frequencies; Low frequencies; Monitoring systems; Morphology; Needles; Residual stress; Residual stresses; Trees; Trees - insulation
• ISSN: 1070-9878; 1558-4135
• DOI: 10.1109/TDEI.2010.5492239

Using a computer-aided image recording monitoring system, extensive measurements have been performed in the inner layer of 66 kV cross-linked polyethylene (XLPE) cables. It has been found that there are three kinds of electrical trees in the samples, the branch-like tree, the bush-like tree and the mixed tree that is a mixture of the above two kinds. When the applied voltage frequency is less than or equal to 250 Hz, only the mixed tree appears in XLPE samples, when the frequency is greater than or equal to 500 Hz, only the dense branch-like tree develops, both of which are attributed to the coexistence of non-uniform crystallization and internal residual stress in semicrystalline XLPE cables during the process of manufacturing. Through the fractal analyses of these electrical trees, it has been found that both the propagation and structure characteristics can be described by fractal dimension directly or indirectly. It is suggested that the propagation and structural characteristics of electrical trees are closely related to the morphology and the residual stress in material at low frequency, i.e., the propagation characteristics of electrical trees depends upon not only the boundaries between big spherulites and amorphous region, but also the impurity, micropore concentration and the relative position of needle electrode tip with respect to spherulites or amorphous region in the low frequency range. However, at high frequency, it has nothing to do with the morphology of material. It is suggested that the injection and extraction process of charge from and to dielectrics via the needle electrode are more intense at high frequency than in low frequency. Thus, it can form relatively uniform dielectric weak region in front of needle electrode, which leads to similar initiation and propagation characteristics of electrical trees at high frequency.