Raman analysis of aluminum nitride at high temperature

• Published in: Materials characterization Vol. 57; no. 2; pp. 105 - 110
• Main Authors: Li, Xiaojun, Zhou, Candong, Jiang, Guochang, You, Jinglin
• Format: Journal Article
• Language: English
• Published: New York, NY Elsevier Inc 01.08.2006; Elsevier Science
• Subjects: Aluminum nitride; Cross-disciplinary physics: materials science; rheology; Exact sciences and technology; Materials science; Phase diagrams and microstructures developed by solidification and solid-solid phase transformations; Physics; Raman spectra; Solidification; Wurtzite structure; Wurtzite structure; Raman spectra; Aluminum nitride; Nitrides; Temperature; Aluminium nitrides; High temperature
• ISSN: 1044-5803; 1873-4189
• DOI: 10.1016/j.matchar.2005.12.012

The Raman spectra of aluminum nitride were measured over the temperature range from room temperature to 1273 K. Frequencies of the E 21, A 1(TO), E 22, E 1(TO), A 1(LO) and E 1(LO) phonon modes are 252, 614, 658, 672, 894 and 912 cm − 1 , respectively. The Raman peaks of A 1(TO) and E 22 modes are shifted toward lower frequency with temperature, which indicate that the compressive stress in the compact of aluminum nitride relax gradually when temperature is increased. The width of the Raman peaks of the A 1(TO) and E 22 modes are also broadened with increasing temperature. The powders of aluminum nitride readily react with water vapor in the air to product Al(OH) 3 or AlOOH. These reaction products will decompose at elevated temperatures; this will affect the measurement of the Raman spectra.