Determination of three-dimensional strain state in crystals using self-interfered split HOLZ lines

An experimental method to measure the strain through the thickness of a crystal is demonstrated. This enables the full three-dimensional stress–strain state of a crystal at the nanoscale to be determined taking the current practice from two-dimensional strain state determination. Knowing the 3D stra...

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Bibliographic Details
Published inUltramicroscopy Vol. 156; pp. 37 - 40
Main Authors Herring, Rodney, Norouzpour, Mana, Saitoh, Koh, Tanaka, Nobuo, Tanji, Takayoshi
Format Journal Article
LanguageEnglish
Published Netherlands Elsevier B.V 01.09.2015
Subjects
CBED
Crystals
Electron diffraction
Electron holography
Interferometry
Nanostructure
Split HOLZ line
Strain
Stress-strain relationships
Three dimensional
Three-dimensional crystal strain
Two dimensional
CBED
Split HOLZ line
Three-dimensional crystal strain
Electron holography
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Summary:An experimental method to measure the strain through the thickness of a crystal is demonstrated. This enables the full three-dimensional stress–strain state of a crystal at the nanoscale to be determined taking the current practice from two-dimensional strain state determination. Knowing the 3D strain state is desired by crystal growers in order to improve their crystal's quality. This method involves combining electron diffraction with electron interferometry in a transmission electron microscope. The electron diffraction uses a split higher order Laue zone (HOLZ) line and the electron interferometry uses an electron biprism.
Bibliography:ObjectType-Article-1
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content type line 23
ISSN:0304-3991
1879-2723
DOI:10.1016/j.ultramic.2015.04.013