Hyperspectral mapping-combining cathodoluminescence and X-ray collection in an electron microprobe

An optical spectrometer has been integrated into a JEOL 8900R electron microprobe, which allows simultaneous collection of light, X‐ray, and electron signals. The cathodoluminescence signal is collected from a monocular eyepiece, which is integrated into the electron optics of the electron microprob...

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Bibliographic Details
Published inMicroscopy research and technique Vol. 67; no. 5; pp. 271 - 277
Main Authors Macrae, Colin M., Wilson, Nicholas C., Johnson, Sally A., Phillips, Peter L., Otsuki, Masayuki
Format Journal Article
LanguageEnglish
Published Hoboken Wiley Subscription Services, Inc., A Wiley Company 01.08.2005
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Summary:An optical spectrometer has been integrated into a JEOL 8900R electron microprobe, which allows simultaneous collection of light, X‐ray, and electron signals. The cathodoluminescence signal is collected from a monocular eyepiece, which is integrated into the electron optics of the electron microprobe. The optical acquisition is synchronized with the stage motion. X‐ray lines of major elements are collected using an energy dispersive spectrometer, X‐ray lines of minor elements are collected using wavelength dispersive spectrometers, and the secondary and backscattered electron signals are collected using standard detectors. In mapping mode of operation the different signals are collected at each pixel with map sizes typically ranging from 1 million to 10 million pixels. This represents a significant amount of data from which the major correlations and associations in the map can be determined. Summing over a small number of channels and examining only a subset of the complete wavelength range are the strategies that have been developed to reduce the size of the data handled. The application of this mapping technique is demonstrated with two examples, zircons and refractory bricks. Zircons with various degrees of metamictization have been characterized, and inclusions differentiated using a combination of cathodoluminescence and X‐ray maps. Examination of refractory bricks reveals subtle chemical changes in the spinel grains. Microsc. Res. Tech. 67:271–277, 2005. © 2005 Wiley‐Liss, Inc.
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ArticleID:JEMT20205
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content type line 23
ISSN:1059-910X
1097-0029
DOI:10.1002/jemt.20205