Dielectric data of ceramic substrates at high frequencies

• Published in: Journal of the European Ceramic Society Vol. 24; no. 6; pp. 1463 - 1466
• Main Authors: Stiegelschmitt, Alfons, Roosen, Andreas, Ziegler, Christof, Martius, Siegfried, Schmidt, Lorenz-Peter
• Format: Journal Article Conference Proceeding
• Language: English
• Published: Oxford Elsevier Ltd 2004; Elsevier
• Subjects: Al 2O 3; Applied sciences; Building materials. Ceramics. Glasses; Ceramic industries; Chemical industry and chemicals; Dielectric properties; Electrotechnical and electronic ceramics; Exact sciences and technology; LTCC; RF properties; Substrates; Technical ceramics; RF properties; LTCC; Dielectric properties; Al 2O 3; Substrates; Substrate; Electrical properties; Low-temperature cofired ceramic materials; Microelectronics; Experimental study; High frequency; Alumina; Oxide ceramics; Dielectric ceramics; Electroceramics
• ISSN: 0955-2219; 1873-619X
• DOI: 10.1016/S0955-2219(03)00580-6

The dielectric constants of standard ceramic substrates like alumina and LTCC have been determined in the frequency range from 1 to 50 GHz. For the measurements cylindrical disk resonators and printed microstrip line resonators on substrates have been prepared. The RF-data have been measured with network analyzers and suitable wafer probe stations, the calculations of the dielectric data have been done on basis of two different simulation programs. The preparation of the samples and the test conditions of both resonator methods have proven to yield reliable results over a wide frequency range.